Microprobe characterization of optoelectronic materials
Auteur :
Jimenez, Juan
Éditeur :
Taylor & Francis Inc
ISBN :
9781560329411
Date de publication :
15 nov. 2002
Dimensions :
22,9 x 15,2 cm
Poids :
1065 g
Langue :
Anglais
Pays d'origine :
USA
Discusses microprobe technique and its usefulness as diagnostic technique for device degradation. This book considers various types of probes (electrons, photons and tips) and different microscopes (optical, electron microscopy and tunneling). It is suitable for researchers, crystal growers and optoelectronic device makers.