Design and analysis of accelerated tests for mission critical reliability
Auteur :
LuValle, Michael J. / LeFevre, Bruce G. / Kannan, SirRaman
Éditeur :
Taylor & Francis Inc
ISBN :
9781584884712
Date de publication :
27 avr. 2004
Dimensions :
23,4 x 15,6 cm
Poids :
476 g
Langue :
Anglais
Pays d'origine :
USA
Presents theory and methods for recognizing and handling the more complicated cases often encountered in practice. This work integrates a physical understanding of underlying phenomena and the statistical modeling of observation 'noise' to provide a single theoretical framework for accelerated testing.