Bayesian process monitoring, control and optimization
Éditeur :
Taylor & Francis Inc
ISBN :
9781584885443
Date de publication :
10 nov. 2006
Dimensions :
23,4 x 15,6 cm
Poids :
612 g
Langue :
Anglais
Pays d'origine :
USA
Presents an introduction that discusses inferential problems and presents modern methods in Bayesian computation. This work explains statistical process control (SPC) and examines both univariate and multivariate process monitoring techniques. It includes material on the Kalman filter, radar detection and discrete part manufacturing.