X-ray diffraction for materials research: from fundamentals to applications
Auteur :
Lee, Myeongkyu
Éditeur :
Apple Academic Press Inc.
ISBN :
9781774635933
Date de publication :
31 mars 2021
Dimensions :
22,9 x 15,2 cm
Poids :
340 g
Langue :
Anglais
Pays d'origine :
Canada
This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how