Characterization of wide bandgap power semiconductor devices
Auteur :
Wang, Fei / Zhang, Zheyu / Jones, Edward A.
Éditeur :
Institution of Engineering and Technology
ISBN :
9781785614910
Date de publication :
31 oct. 2018
Dimensions :
23,4 x 15,6 cm
Langue :
Anglais
Pays d'origine :
Grande Bretagne
This book is an authoritative overview of Wide Bandgap (WBG) device characterization providing essential tools to assist the reader in performing both static and dynamic characterization of WBG devices, particularly those based on using silicon carbide (SiC) and gallium nitride (GaN) power semiconductors.