Aberration-corrected imaging in transmission electron microscopy: an introduction
Auteur :
Erni, Rolf
Éditeur :
Imperial College Press
ISBN :
9781848165366
Date de publication :
1 sept. 2010
Langue :
Anglais
Pays d'origine :
Grande Bretagne
Presents an introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. This book addresses advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science.