X-ray scattering from semiconductors (2nd edition)
Auteur :
Fewster, Paul F
Éditeur :
Imperial College Press
ISBN :
9781860943607
Date de publication :
8 juil. 2003
Langue :
Anglais
Pays d'origine :
Grande Bretagne
A practical guide to the analysis of materials, including a description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general.