Plugged in: cybersecurity in the modern age
Auteur :
Silman, Jon
Éditeur :
University Press of Florida
ISBN :
9781942852131
Date de publication :
11 janv. 2017
Dimensions :
21,5 x 13,9 x 0,6 cm
Poids :
525 g
Langue :
Anglais
Pays d'origine :
USA
In Plugged In, we meet the men and women at the Florida Institute for Cybersecurity Research who have devoted their careers to studying and staying one step ahead of the bad guys. Their stories detail the far-reaching impact of UF's research, technologies, and innovations - and the UF faculty members dedicated to them.