Noise in nanoscale semiconductor devices
Éditeur :
Springer Nature Switzerland AG
ISBN :
9783030375027
Date de publication :
27 avr. 2021
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models.