Yield-aware analog ic design and optimization in nanometer-scale technologies
Auteur :
Canelas, António Manuel Lourenço / Guilherme, Jorge Manuel Correia / Horta, Nuno Cavaco Gomes
Éditeur :
Springer Nature Switzerland AG
ISBN :
9783030415389
Date de publication :
21 mars 2021
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm.