Stem pathway and student retention, the: lessons applied and best practices through peer mentoring
Auteur :
Harrell, Carita / Capco, David G.
Éditeur :
Springer Nature Switzerland AG
ISBN :
9783030658632
Date de publication :
12 mars 2021
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
The program works because the social reality is that the peer mentor has a better repertoire with the first semester freshmen than the faculty or staff and assists with student success.