Design for testability, debug and reliability: next generation measures using formal techniques
Auteur :
Huhn, Sebastian / Drechsler, Rolf
Éditeur :
Springer Nature Switzerland AG
ISBN :
9783030692117
Date de publication :
20 avr. 2022
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.