Low substrate temperature modeling outlook of scaled n-mosfet
Auteur :
Ashraf, Nabil Shovon
Éditeur :
Springer International Publishing AG
ISBN :
9783031009068
Date de publication :
13 juil. 2018
Dimensions :
23,5 x 19,1 cm
Langue :
Anglais
Pays d'origine :
Suisse
In addition, subthreshold slope which is an indicator of how speedily the device drain current can be switched between near off current and maximum drain current is an important device attribute to model at lower operating substrate temperatures.