Fine-grained image analysis: modern approaches
Auteur :
Wei, Xiu-Shen
Éditeur :
Springer International Publishing AG
ISBN :
9783031313769
Date de publication :
5 juil. 2024
Dimensions :
24,0 x 16,8 cm
Langue :
Anglais
Pays d'origine :
Suisse
This book provides a comprehensive overview of the fine-grained image analysis research and modern approaches based on deep learning, spanning the full range of topics needed for designing operational fine-grained image systems.