Statistical degradation data analysis: semiparametric and nonparametric stochastic process approaches
Auteur :
Ng, Hon Keung Tony / Palayangoda, Lochana
Éditeur :
Springer Nature Switzerland AG
ISBN :
9783032278159
Date de publication :
20 sept. 2026
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
font-family: 'Times New Roman',serif; Because many systems are equipped with sensors that collect degradation measurements over time, statistical degradation modeling plays an important role in understanding the evolution of such processes and supporting reliability assessment.