Software failure investigation: a near-miss analysis approach
Auteur :
Eloff, Jan / Bihina Bella, Madeleine
Éditeur :
Springer International Publishing AG
ISBN :
9783319613338
Date de publication :
18 sept. 2017
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
This book reviews existing operational software failure analysis techniques and proposes near-miss analysis as a novel, and new technique for investigating and preventing software failures.