Phase change memory: device physics, reliability and applications
Éditeur :
Springer International Publishing AG
ISBN :
9783319690520
Date de publication :
28 nov. 2017
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
This book describes the physics of phase change memory devices, starting from basic operation to reliability issues. The book also contains design engineering details on PCM cell architecture, PCM cell arrays (including electrical circuit management), as well as the full spectrum of possible future applications.