Optical characterization of thin solid films
Éditeur :
Springer International Publishing AG
ISBN :
9783319753249
Date de publication :
19 mars 2018
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics.