Ellipsometry of functional organic surfaces and films
Éditeur :
Springer International Publishing AG
ISBN :
9783319758947
Date de publication :
23 mai 2018
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces.