Nanotechnology: principles and practices
Auteur :
Kulkarni, Sulabha K.
Éditeur :
Springer International Publishing AG
ISBN :
9783319791630
Date de publication :
27 mars 2019
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
The book also explains the functional principles of essential techniques, such as scanning tunneling microscopy (STM), atomic force microscopy (AFM), scanning near field optical microscopy (SNOM), Raman spectroscopy and photoelectron microscopy.