Helium ion microscopy
Éditeur :
Springer International Publishing AG
ISBN :
9783319824734
Date de publication :
16 juin 2018
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field.