Quantum metrology, imaging, and communication
Auteur :
Simon, David S. / Jaeger, Gregg / Sergienko, Alexander V.
Éditeur :
Springer International Publishing AG
ISBN :
9783319835402
Date de publication :
4 juil. 2018
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.