Electromigration inside logic cells: modeling, analyzing and mitigating signal electromigration in nanocmos
Auteur :
Posser, Gracieli / Sapatnekar, Sachin S. / Reis, Ricardo
Éditeur :
Springer International Publishing AG
ISBN :
9783319840413
Date de publication :
5 juil. 2018
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power.