Contactless vlsi measurement and testing techniques
Auteur :
Sayil, Selahattin
Éditeur :
Springer International Publishing AG
ISBN :
9783319888194
Date de publication :
4 sept. 2018
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing.