Nanomechanical and nanoelectromechanical phenomena in 2d atomic crystals: a scanning probe microscopy approach
Auteur :
Kay, Nicholas D.
Éditeur :
Springer International Publishing AG
ISBN :
9783319888989
Date de publication :
4 sept. 2018
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
This thesis introduces a unique approach of applying atomic force microscopy to study the nanoelectromechanical properties of 2D materials, providing high-resolution computer-generated imagery (CGI) and diagrams to aid readers’ understanding and visualization.