Lock-in thermography: basics and use for evaluating electronic devices and materials
Auteur :
Breitenstein, Otwin / Warta, Wilhelm / Schubert, Martin C.
Éditeur :
Springer International Publishing AG
ISBN :
9783319998244
Date de publication :
22 janv. 2019
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Suisse
Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems.