Thin film analysis by x-ray scattering
Auteur :
Birkholz, Mario
Éditeur :
Wiley-VCH Verlag GmbH
ISBN :
9783527310524
Date de publication :
15 nov. 2005
Dimensions :
24,3 x 17,7 x 3,0 cm
Poids :
765 g
Langue :
Anglais
Pays d'origine :
Allemagne
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films.