Surface and thin film analysis: a compendium of principles, instrumentation, and applications
Éditeur :
Wiley-VCH Verlag GmbH
ISBN :
9783527320479
Date de publication :
20 avr. 2011
Dimensions :
24,9 x 18,0 x 3,2 cm
Poids :
1175 g
Langue :
Anglais
Pays d'origine :
Allemagne
Completely revised and updated, this second edition of a bestseller surveys and compares all techniques relevant for practical applications. New chapters cover such recent methods as SNOM, SERS, and laser ablation. With over 500 references and a list of equipment suppliers.