Positron annihilation in semiconductors: defect studies
Auteur :
Krause-Rehberg, Reinhard / Leipner, Hartmut S.
Éditeur :
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
ISBN :
9783642084034
Date de publication :
1 déc. 2010
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Allemagne
The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods.