Auger- and x-ray photoelectron spectroscopy in materials science: a user-oriented guide
Auteur :
Hofmann, Siegfried
Éditeur :
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
ISBN :
9783642273803
Date de publication :
25 oct. 2012
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Allemagne
Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor.