Academic achievement assessment: principles and methodology
Auteur :
Tian, Huisheng / Sun, Zhichang
Éditeur :
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
ISBN :
9783662585719
Date de publication :
19 janv. 2019
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Allemagne
This book consists of introduction to academic achievement assessment, international comparison of academic achievement assessment and reference, as well as theoretical system and practice strategy of academic achievement assessment.