Nanoscale redox reaction at metal/oxide interface: a case study on schottky contact and reram
Auteur :
Nagata, Takahiro
Éditeur :
Springer Verlag, Japan
ISBN :
9784431548492
Date de publication :
22 mai 2020
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Japon
Oxide materials are good candidates for replacing Si devices, which are increasingly reaching their performance limits, since the former offer a range of unique properties, due to their composition, design and/or doping techniques.