Electron nano-imaging: basics of imaging and diffraction for tem and stem
Auteur :
Tanaka, Nobuo
Éditeur :
Springer Verlag, Japan
ISBN :
9784431569398
Date de publication :
3 août 2024
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Japon
In this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advancement of electron microscopy such as differential phase contrast (DPC) STEM, sparse-coding image processing and quantum electron microscopy have been supplemented with further details.