On-wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond
Auteur :
Rumiantsev, Andrej
Éditeur :
River Publishers
ISBN :
9788770221122
Date de publication :
31 juil. 2019
Dimensions :
23,4 x 15,6 cm
Poids :
526 g
Langue :
Anglais
Pays d'origine :
Danemark
This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies.