Ionizing radiation effects in mos oxides
Éditeur :
World Scientific Publishing Co Pte Ltd
ISBN :
9789810233266
Date de publication :
26 janv. 2000
Langue :
Anglais
Pays d'origine :
Singapour
As a result of work on the nature of the electrically active defects in MOS oxides which are generated by exposure to ionizing radiation, the understanding of the basic physical mechanisms has evolved. This text summarizes the new work and integrates it with older work to form a unified picture.