Cmos rf circuit design for reliability and variability
Auteur :
Yuan, Jiann-Shiun
Éditeur :
Springer Verlag, Singapore
ISBN :
9789811008825
Date de publication :
21 avr. 2016
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Singapour
The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits.