High-level estimation and exploration of reliability for multi-processor system-on-chip
Auteur :
Wang, Zheng / Chattopadhyay, Anupam
Éditeur :
Springer Verlag, Singapore
ISBN :
9789811093210
Date de publication :
12 mai 2018
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Singapour
This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors.