Migration imaging of the transient electromagnetic method
Auteur :
Li, Xiu / Xue, Guoqiang / Yin, Changchun
Éditeur :
Springer Verlag, Singapore
ISBN :
9789811096884
Date de publication :
29 juin 2018
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Singapour
This book is based on more than a decade of research the authors have pursued on the pseudo-seismic migration imaging of the transient electromagnetic method, and provides a series of important findings on the theory and applications in this area.