Progress in nanoscale characterization and manipulation
Éditeur :
Springer Verlag, Singapore
ISBN :
9789811304538
Date de publication :
14 sept. 2018
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Singapour
It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy.