Test generation of crosstalk delay faults in vlsi circuits
Auteur :
Jayanthy, S. / Bhuvaneswari, M.C.
Éditeur :
Springer Verlag, Singapore
ISBN :
9789811347849
Date de publication :
21 déc. 2018
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Singapour
The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults.