Investigations on rf breakdown phenomenon in high gradient accelerating structures
Auteur :
Shao, Jiahang
Éditeur :
Springer Verlag, Singapore
ISBN :
9789811356834
Date de publication :
23 déc. 2018
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Singapour
This book mainly focuses on the experimental research of rf breakdown and field emission with novel methods, including triggering rf breakdown with high intensity laser and pin-shaped cathodes as well as locating field emitters with a high resolution in-situ imaging system.