Multilayer magnetic nanostructures: properties and applications
Auteur :
Sigov, Alexander S.
Éditeur :
Springer Verlag, Singapore
ISBN :
9789811962486
Date de publication :
15 juin 2024
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Singapour
It is shown that the detected domain walls appear exactly at the locations of the atomic steps, and their thickness increases in proportion to the film thickness with a proportionality coefficient of the order of one.