Built-in fault-tolerant computing paradigm for resilient large-scale chip design: a self-test, self-diagnosis, and self-repair-based approach
Auteur :
Li, Xiaowei / Yan, Guihai / Liu, Cheng
Éditeur :
Springer Verlag, Singapore
ISBN :
9789811985539
Date de publication :
3 mars 2024
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Singapour
The proposed built-in on-chip fault-tolerant computing paradigm has been verified in a broad range of scenarios, from small processors in satellite computers to large processors in HPCs.