Vlsi design and test: 23rd international symposium, vdat 2019, indore, india, july 4–6, 2019, revised selected papers
Éditeur :
Springer Verlag, Singapore
ISBN :
9789813297661
Date de publication :
18 août 2019
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Singapour
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design;