Improving tests for discrete small sample data
Auteur :
Taneichi, Nobuhiro / Sekiya, Yuri
Éditeur :
Springer Verlag, Singapore
ISBN :
9789819553006
Date de publication :
22 mai 2026
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Singapour
This book provides a guide for improving test statistics that are based on phi-divergence for discrete models, which include various kinds of independence models of contingency tables as well as generalized linear models of binary data.