Credit rating migration risks in structure models
Auteur :
Liang, Jin / Hu, Bei
Éditeur :
Springer Verlag, Singapore
ISBN :
9789819721788
Date de publication :
5 juil. 2024
Dimensions :
23,5 x 15,5 cm
Langue :
Anglais
Pays d'origine :
Singapour
The book is involved various mathematical models, such as PDE, numerical simulation etc., some of them are interesting mathematical problems, so that, and a good reference book to study mathematical modeling in credit rating migration.